Atomic Force Microscopy (AFM) Analysis

Main Applications of AFM Analysis

 

 

• Atomic Force Microscope, AFM is a surface technique that using a tiny tip (cantilever) as sensor to investigate surface of a sample. Using AFM, it is possible for us to measure a roughness of a sample surface at a high resolution, in order to distinguish a sample based on its mechanical properties (Eg: hardness and roughness).

 

 

 

 

Applications:

 

• Microbes

• Thin film 

• Fabric

• Polymer

• Nano materials

 

 

Example AFM Result