Main Applications of FESEM/EDX Analysis

 

 

• Scanning Electron Microscopy (SEM) provides high-resolution and long-depth-of-field images of the sample surface and near-surface. SEM is one of the most widely used analytical tools due to the extremely detailed images it can quickly provide. Coupled to an auxiliary Energy Dispersive X-ray Spectroscopy (EDS) detector, SEM also offers elemental identification of Scanning Electron Microscopy (SEM) technique from Evans Analytical Group (EAG).nearly the entire periodic table.

 

Applications:

 

• Particle Analysis

• Contamination

• Thickness of Films

• Delamination (peeling)

• Complete unknown

• Good versus Bad

• A versus B

• Element composition

• Multi-point QC